se1700.gif (10832 bytes) Surface Measuring Instrumentation

A highly advanced and compact multi-function unit...
  The very accurate and compact Surfcorder incorporates a unique touch screen multi-layer control window which displays all the necessary pages of instruction function and parameters required to preset and measure. The screen also has the facility to operate the instrument at “two levels” of measurement, allowing the major benefit of instant selection of alternative surface analysis programs without having to change original settings.

System features and innovations
• Multiple measurement parameters.
• Five modes of operation.
• Memory - up to 16 sets of measurements.
• Fine chart data outputs.
• Real time recordings.
• Vertical/horizontal calibration.
• Partial cut out of graphical recordings.
• R2m tip radius with 0.7mN force stylus.
• Re-calculation from stored data.
• Statistical analysis (SPC).
• High and low limits.
• Inch or metric selection.
SPECIFICATIONS
Measuring System Stylus method using Inductive (LVDT) Pick-up with interchangeable Styli, Skid and Skidless mode of operation.
Measurement parameters Ra(Ra75), Rq, RMS, Ry, Rmax, Rz, Sm, tp, SK, Kr, Rp, Rv, Pc, PPI, HSC, Rpm, Rz3, R3zmax, R3z, wpe5.jpg (688 bytes)a, wpe4.jpg (688 bytes)q, wpe3.jpg (673 bytes)a, wpe3.jpg (673 bytes)q, Dq, RK, Rpk, Rvk, MR1, Mr2, WCA, WCM, BC, ADC.
Profile     Un-filtered, Filtered (Roughness), Filtered Waviness, Filtered Centerline Waviness
Measuring range 800m(1,600m*) 80m(160m*) 8m(16m*) -
Magnification Vertical 100, 200, 500,1,000 2,000, 5,000, 10,000 20,000, 50,000, Auto
Horizontal 1, 2, 5, 10, 20, 50, 100, 200, 500,1000, Auto.
Resolution 0.5nm(min.)
Cut-off Roughness 0.08, 0.25, 0.8, 2.5, 8mm and un-filtered.
Waviness f l 0.25, 0.8, 2.5, 8mm-fho.08, 0.25, 0.8, 2.5mm and fh0.08, 0.25, 0.8, 2.5mm.
Filter Gaussian / 2CR / Special Gaussian.
Measuring length Evaluation length : wpe6.jpg (688 bytes)c x 1, x 2, x 3, x 4, x 5 times 0.25, 0.8, 2.5, 8, 25mm. (Selectable up to 30mm with real time recording).
Drive speed 0.05,0.1, 0.5, 1,2mm/s
Data display 320 x 240 dots LCD.
Data recording 8 dots/mm graphic printer; recording width: 56mm; paper width 59mm; length 25 meters.
Measurement mode Normal, average, multiple continuous, cut-out, parabola, externally controlled measurement mode.
Applicable standards ISO, ANSI, BS, DIN(90/85), DIN4776, JIS(94/82), and JIS waviness.
Instrument calibration V/H Both directions (automatic calibration/coefficient calibration).
Partial cut-out; Surface profile to be cut-out selected in display window.
Measuring conditions memory Stores two sets of data. Equipped w/ memory card driver (16 memories / card).
Data output RS232C
Acceptability judgment Possible with 3 parameters.
Statistical processing X, R, Max, Mm, S, Sigma, X-R control chart, frequency distribution table, X-R control chart, histogram.
Real time recording Surface profiles direct in display and printer at same time.
Print out data Selectable each item to print-out, 2 steps of automatic feed,
comment (alphanumeric and symbols), date and time.
Auxiliary functions Meter/inch switching, Japanese/English display switching, repeated arithmetic processing, selectable return speed, selectable prelength, auto return, motorized up/down by optional column. Measuring conditions in data printout / display.
Drive unit 50-mm vertical pick-up movement with 5mm fine adjustment, leveling 1.5
Straightness accuracy 0.3m/30mm or less.
Stylus/contact force R2m diamond, 0.7mN.
Skid R40mm (measuring direction)x R2mm made of sapphire.
Power supply 85-264 VAC, 50/60Hz.
Ambient temp/humidity (operation) 10-35C, 80% RH or lower, no dew condensation.
Ambient temp/humidity (storage) 0-50C, 90% RH or lower, no dew condensation.
Size/weight Pick-up wpe8.jpg (672 bytes)17mm-L80mm/70g; Drive unit: W168 x D74 x H70mm / 0.9kg Amplifier: W168 x D360 x H150mm/4.5kg.

STANDARD COMBINATIONS
Pick up PU-AA2
Drive unit DR-30X31
Amplifier AS-1700
Calibration Specimen SS-N


All specifications subject to change without prior notice.

Site developed and maintained by
Bender Associates, Inc.
Copyright 1998 - 2008.  All rights reserved.
Revised: February 18, 2010.


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