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Automated
Analytical Microscopes
The A-Zoom2 is a variable power
viewing system that represents the
next generation of analytical
microscopes for use in
microelectronics inspection,
development, testing and analysis.
Designed for the Probing Market
where it is necessary to locate and
inspect very fine electronic traces
using even finer electronic probes.
The microscope used in a probe
station or as a stand-alone system,
routinely resolves feature geometry
in the sub-micron range. The A-Zoom2
does this by combining a zoom system
(10X or 40X depending on the model)
with a series of long working
distance objectives for maximum
flexibility. Both eyepieces and
video viewing are available. An
optional second viewing axis (NAVCAM)
may be used for continuous low
magnification tracking. Our unique
laser adapter option offers
flexibility for all your
micro-machining, layer passivation,
circuit repairs, test and R & D
needs. The A-Zoom2 is available as
an OEM Probe Head (with or without
an attached focus mechanism), or as
a free standing bench model.
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