SYSTEMS FROM:
- KINETEC SYSTEMS
- PRIOR - Defect Review System
- SIGHTECH -Self Learning Machine Vision
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KINETEK SYSTEMS
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Kinemate Defect Review |
- KLA, Tencor, ADE (Estek) & Inspex formats
- Wafer and Defect Map Preview feature
- Automatic Rotation on limited travel stages
- Many defect file Filtering options
- Floating Toolbars, Tool Tips, Zoom features
- Customize for Production/Analysis environs
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Kinetek Inspection
- Preprogrammed Site Inspection
- Point to Point or Velocity Scan Modes
- Defect Logging and Classification
- Wafer Sorting Option
- OCR interfacing capability
- High Throughput
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Patterned or Unpatterned
Wafers
Accurate 3 Point Alignment Algorithm
Live Image in a Window
Image Capture/Storage to most Archives/Databases
Confocal Microscope Option |
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PRIOR Defect Review System
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SIGHTECH-Self
Learning Machine Vision
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SIGHTech makes the
self-learning Eyebot, which helps companies inspect their products
and processes for visual defects. Eyebot improves your quality
control, increases your throughput, augments your yield, and
raises your customer satisfaction.
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Site developed and maintained by
Bender Associates, Inc.
Copyright 1998 - 2004. All rights reserved.
Revised: September 28, 2004.
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